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On a Weibull related distribution model with decreasing, increasing and upside-down bathtub-shaped failure rate

PROCEEDINGS ARTICLE published January 2013 in 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)

Authors: R. Dwight | K. El-Akruti

Failure data analytics to build failure prediction mechanisms

PROCEEDINGS ARTICLE published November 2013 in 2013 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)

Authors: Sandipan Dey | Kandathil Koshy Jacob | Javier Alonso Lopez | Kishor Trivedi

Predictive analytics: Assessing failure rate accuracy & failure mode completeness

PROCEEDINGS ARTICLE published January 2013 in 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)

Authors: J. V. Bukowski | W. M. Goble

Reliability Prediction of Smartphone Applications through Failure Data Analysis

PROCEEDINGS ARTICLE published December 2013 in 2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing

Authors: Sonia Meskini | Ali Bou Nassif | Luiz Fernando Capretz

Radiation effects and reliability: Physical mechanisms and rate prediction

PROCEEDINGS ARTICLE published October 2013 in 2013 IEEE International Integrated Reliability Workshop Final Report

Authors: Ronald D. Schrimpf

Detailed electrical and reliability study of tapered TSVs

PROCEEDINGS ARTICLE published October 2013 in 2013 IEEE International 3D Systems Integration Conference (3DIC)

Authors: Tiantao Lu | Ankur Srivastava

Practical Bayesian methods for determining device failure rates from zero-failure data

PROCEEDINGS ARTICLE published January 2013 in 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)

Authors: M. V. Bremerman

Big data integration

PROCEEDINGS ARTICLE published April 2013 in 2013 IEEE 29th International Conference on Data Engineering (ICDE)

Authors: X. L. Dong | D. Srivastava

Rate-reliability-complexity tradeoff for ML and lattice decoding of full-rate codes

PROCEEDINGS ARTICLE published July 2013 in 2013 IEEE International Symposium on Information Theory

Authors: Arun Singh | Petros Elia | Joakim Jalden

Failure recovery mechanism caused by secondary defect

PROCEEDINGS ARTICLE published April 2013 in 2013 IEEE International Reliability Physics Symposium (IRPS)

Authors: S. Karki | D. Nguyen

Estimation of failure rate of consumer products based on components failure rate and its product safety assessment

PROCEEDINGS ARTICLE published October 2013 in 2013 IEEE Symposium on Product Compliance Engineering (ISPCE)

Authors: Yasuo Harada | Tetsusei Kurashiki | Norakarntiansin Waris | Masaru Zako

Permlyzer: Analyzing permission usage in Android applications

PROCEEDINGS ARTICLE published November 2013 in 2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE)

Authors: Wei Xu | Fangfang Zhang | Sencun Zhu

Protecting data against unwanted inferences

PROCEEDINGS ARTICLE published September 2013 in 2013 IEEE Information Theory Workshop (ITW)

Authors: Supriyo Chakraborty | Nicolas Bitouze | Mani Srivastava | Lara Dolecek

Reliability analysis for a multi-unit system with failure rate interaction

PROCEEDINGS ARTICLE published July 2013 in 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

Authors: Zhirong Li | Qi Gao | Shenyang Liu | Gang Liu

Dependability and security-based failure considerations in protection system reliability studies

PROCEEDINGS ARTICLE published October 2013 in IEEE PES ISGT Europe 2013

Authors: Vijay Venu Vadlamudi | Oddbjorn Gjerde | Gerd Kjolle

A Data Warehouse Solution for Analyzing RFID-Based Baggage Tracking Data

PROCEEDINGS ARTICLE published June 2013 in 2013 IEEE 14th International Conference on Mobile Data Management

Authors: Tanvir Ahmed | Torben Bach Pedersen | Hua Lu

Estimating component reliabilities from incomplete system failure data

PROCEEDINGS ARTICLE published January 2013 in 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)

Authors: F. Szidarovszky

Localization of electrical active defects caused by reliability-related failure mechanism by the application of Lock-in Thermography

PROCEEDINGS ARTICLE published April 2013 in 2013 IEEE International Reliability Physics Symposium (IRPS)

Authors: C. Schmidt | K. Wadhwa | A. Reverdy | E. Reinders

Practical applications of mixture models to complex time-to-failure data

PROCEEDINGS ARTICLE published January 2013 in 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)

Authors: D. Steffey

Failure rate adjustment factors for high technology components

PROCEEDINGS ARTICLE published June 2013 in 2013 IEEE 25th Symposium on Fusion Engineering (SOFE)

Authors: Lee C. Cadwallader